Qualcomm Qcc5161
4 CVEs affecting Qualcomm Qcc5161. Latest disclosed: 2025-11-04. Critical: 0, High: 3.
| CVE | Severity | Score | Published | Summary |
|---|---|---|---|---|
CVE-2025-47317 | High | 7.8 | 2025-09-24 | Memory corruption due to global buffer overflow when a test command uses an invalid payload type. |
CVE-2025-47318 | High | 7.5 | 2025-09-24 | Transient DOS while parsing the EPTM test control message to get the test pattern. |
CVE-2025-47342 | High | 7.1 | 2025-10-09 | Transient DOS may occur when multi-profile concurrency arises with QHS enabled. |
CVE-2025-47370 | Medium | 6.5 | 2025-11-04 | Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan. |