What is CVE-2023-21517?

CVE-2023-21517 is a high-severity vulnerability in Samsung Exynos, classified under Buffer Copy without Checking Size of Input (Classic Buffer Overflow). CVSS score: 8.8/10. Published 2023-06-28.

How severe is CVE-2023-21517?

High severity. CVSS v3 base score is 8.8 out of 10.

Is CVE-2023-21517 known to be exploited?

1 public proof-of-concept repositories are indexed. Not currently listed in the CISA KEV catalog.

Buffer overflow in Samsung Exynos

CVE-2023-21517

Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.

Vulnerability class: Buffer Overflow

EPSS: 0.016 (73.1th percentile) — read the EPSS interpretation.

CVSS v3 metric

CVSS v3 base score 8.8 (High). Vector: CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H.

Affected products

Samsung Exynos
Samsung Mobile Devices — versions Select devices using Exynos CP chipsets

Weakness classification (CWE)

Public proof-of-concept exploits

fkie-cad/nvd-json-data-feeds

References

mobile.security@samsung.com (Vendor Advisory)

Frequently asked questions

What is CVE-2023-21517?: CVE-2023-21517 is a high-severity vulnerability in Samsung Exynos, classified under Buffer Copy without Checking Size of Input (Classic Buffer Overflow). CVSS score: 8.8/10. Published 2023-06-28.
How severe is CVE-2023-21517?: High severity. CVSS v3 base score is 8.8 out of 10.
Is CVE-2023-21517 known to be exploited?: 1 public proof-of-concept repositories are indexed. Not currently listed in the CISA KEV catalog.