Resource exhaustion in Qualcomm Sd 205
CVE-2018-11828
When FW tries to get random mac address generated from new SW RNG and ADC values read are constant then DUT get struck in loop while trying to get random ADC samples in Snapdragon Mobile in version SD 210/SD 212/SD 205, SD 425, SD 430, SD 450, SD 625, SD 650/52
Vulnerability class: DoS (Denial of Service)
Published · last modified .
CVSS v3 metric
CVSS v3 base score 7.5 (High). Vector: CVSS:3.0/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H.
EPSS exploit prediction
EPSS: 0.011 (64.8th percentile), scored .
Low probability of exploitation in the next 30 days, but still tracked. 65th percentile — 64.8% of CVEs in the catalogue have a lower EPSS than this one. How to read EPSS.
EPSS over last 30 days · oldest: 0.011 · newest: 0.011 · change: 0.000
Affected products
Weakness classification (CWE)
References
- www.qualcomm.com/company/product-security/bulletins (Vendor Advisory)
- www.securityfocus.com/bid/107681 (VDB Entry, Third Party Advisory, vdb-entry)
Frequently asked questions
- What is CVE-2018-11828?
- CVE-2018-11828 is a high-severity vulnerability in Qualcomm Sd 205, classified under Uncontrolled Resource Consumption. CVSS score: 7.5/10. Published 2018-10-26.
- How severe is CVE-2018-11828?
- High severity. CVSS v3 base score is 7.5 out of 10.